Contact Geometrical Study for Top Emitting 980 nm InGaAs/GaAsP Vertical-Cavity Surface Emitting Lasers

Chaqmaqchee, Faten A. (2021) Contact Geometrical Study for Top Emitting 980 nm InGaAs/GaAsP Vertical-Cavity Surface Emitting Lasers. ARO-THE SCIENTIFIC JOURNAL OF KOYA UNIVERSITY, 9 (2). pp. 112-116. ISSN 2410-9355

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Official URL: http://dx.doi.org/10.14500/aro.10845

Abstract

Geometrical contacts of a double mesa structure with 16 rows ×15 columns arrays of top emitting GaAs based 980 nm vertical cavity surface emitting lasers (VCSELs) are fabricated and characterized. In this paper, 5 strained In0.22Ga0.78As/Ga0.9AsP0.1 quantum wells (QWs) within λ/2 thick cavity have been employed. The top and the bottom epitaxially grown mirrors are based on the linear graded Al0.9Ga0.1As/GaAs distributed Bragg reflectors (DBRs) with 20.5 and 37 periods, respectively. Static parameters including threshold currents, rollover currents, maximum optical output power and wall-plug efficiency are extracted from light out power-current-voltage (LIV) of VCSELs with fixed oxide aperture diameter of ∅~ 6 μm and various mesa2 diameters. In addition, spectral emission for 980 nm VCSELs of oxide aperture between ∅~ 6 and 19 μm and with fixed ∅~ 6 μm and different bias currents are analyzed. The highest optical output power of around 33 dBm is observed at bias current of 0.8 mA for short−reach optical interconnect applications.

Item Type: Article
Uncontrolled Keywords: Vertical-cavity surface emitting laser, AlGaAs Distributed Bragg reflectors, InGaAs/GaAsP quantum wells, Static characterization
Subjects: Q Science > QC Physics
Divisions: ARO-The Scientific Journal of Koya University > VOL 9, NO 2 (2021)
Depositing User: Dr Salah Ismaeel Yahya
Date Deposited: 29 Mar 2022 06:26
Last Modified: 29 Mar 2022 06:26
URI: http://eprints.koyauniversity.org/id/eprint/300

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